Double-sided Spring Pogo Pin Test Probe SCPC028 Series for IC Inspection

Double-sided Spring Pogo Pin Test Probe SCPC028 Series for IC Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

This product SCPC028 we will introduce is 0.28 mm in barrel diameter and 6.7 mm in total length. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production.

The barrel of this double-ended pogo pin is made from phosphor bronze plated with gold or gold clad phosphor bronze. The bottom plunger is made from beryllium copper plated with nickel and gold. The Top plunger is made from SK4 plated with gold and nickel. The inner spring is made from music wire plated with gold and nickel. This probe pin could withstand the current up to 2 amps. The typical maximal contact resistance is about 100 milliohms.

The plunger can be pressed at a distance of up to 1 mm. But it is better to be pressed at a distance of 0.8 mm at most in working environments. Otherwise, the spring will probably be damaged severely under constant pressure. When the plunger is pressed at a distance of 0.8 mm, the loaded force is about 12 or 18 gf, which fluctuates to a tolerance.

For details, please check parameters in below table.

Materials (plated)
Barrel: Ph/SP, Au on Ni Plated
Bottom Plunger: BeCu, Au on Ni Plated
Top Plunger: SK4, Au on Ni Plated
Spring: SWP-A/B, Au on Ni Plated

Electronic Specification:
Current Rating: 2 amps
Contact Resistance: 100 milliohms max
Bandwidth: 7.7 GHz at -1dB
Inductive Reactance: 1MHZ at -0.02322 uH
Capacitive Reactance: 1MHZ at 1.09432 uF

Specifications:
Full Stroke: 1 mm
Rated Stroke: 0.8 mm
Spring Force: 12±3 gf at load 0.8 mm, 18±5 gf at load 0.8 mm
Mechanical Life: about 100000 cycles

For more information, please check below catalog.

Company Information:
Centalic Technology Development Ltd was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.