Walk In( ESS Chamber) Rapid Temperature Change Test Chamber

Application
JOEO professional Walk In ess chamber controlled environmental chambers temperature cyclic stress screening is to change the external environmental stress by using the temperature acceleration technique (the product produces alternating expansion and contraction when circulating in the upper and lower extreme temperatures) under the design strength limit, so as to generate thermal stress and strain in the product.If you need more models about our test equipment, please reference our chamber-testing（.）com
Feature
Walk In ess Chamber simulate rapid temperature transition rates for faster product temperature changes based on your testing requirements - testing your products and yielding defects faster. feature enhanced air flow with larger compressors for change rates to 15C/min and higher. JOEO climatic test chamber support reach in, walk in, drive in and custom fast change rate test chambers that are designed for your specific
Can set the temperature variable rate of the different stress screening
Can perform a rapid temperature change (ESS), condensation test, high temperature and humidity test, temperature and humidity cycling test, etc.
Meet requirements of stress screening test（ESS Test） for electronic equipment
Test methods:Switching temperature & average temperature
Support variety of stress screening (fast temperature change rate) 5deg C/min, 10deg C/min, 15deg C/min experimental conditions
Meet Standards for electronic equipment MIL-STD-2164, MIL-344A-4-16, MIL-2134A-19, NABMAT-9492, GJB-1032-90, GJB/Z34-5.1.6, IPC-9701....ETC.
Have 2 test methods:
①temperature test

②average temperature test

With aluminum sheet test machine load capacity (non plastic load)
Single machine can perform fast temperature change (ESS), condensation test, high temperature and humidity test, temperature and humidity cycling test, etc.
Following sample load customized with a large ESS Chamber
Built in two-way USB2.0 portable storage interface (can copy the test curve and load the test program)
Complete real-time test curve analysis shows that no time limit
Can be integrated with the E management system to monitor the management system